Länge • Longueur • Lunghezza •Length
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| F. Meli, A. Küng, R. Thalmann Ultrapräzises Koordinatenmessgerät für Mikroteile metINFO, Vol. 12, No. 3, S.4-10, 2005 |
| F. Meli,
M. Bieri, R. Thalmann, M. Fracheboud, J.-M. Breguet, R. Clavel,
S. Bottinelli Tastsinn von Koordinatenmessgeräten verfeinert metINFO 10/1, S. 4-9, 2003 |
| F. Meli,
R. Thalmann Das Metrologie-Rasterkraftmikroskop OfmetInfo, 6/1, 1999 |
| M. Degoumois Un "long" laboratoire de mesure OfmetInfo, 5/2, 1998 |
| R. Thalmann Winkelmessung am EAM Teil2: Einrichtung und Messmöglichkeiten OfmetInfo, 3/2, 1996 |
| R. Thalmann Winkelmessung am EAM Teil1: Einführung in die Winkelmesstechnik OfmetInfo, 3/2, 1996 |
| R. Thalmann, Jürg Spiller Rundheitsmessung mit Nanometer-Genauigkeit OfmetInfo, 1/2, 1994 |
| B. G. Vaucher,
R. Thalmann, H. Baechler Europäische Vergleichsmessung von Endmassen OFMETInfo, 1/1, 1994 |
| R. Thalmann, Wenmei Hou Ein neues Interferenz-Luftrefraktometer OfmetInfo, 1/1, 1994 |
Internationale Messvergleiche
• Comparaisons internationales • International Comparisons • Confronti
internazionali
| R. Thalmann Kalibrierung von Messbändern im internationalen Vergleich metINFO, Vol. 12, Nr. 1, S. 15-16, 2005 |
| F. Meli Wertvolle Erkenntnisse gewonnen : wichtige Messvergleiche auf dem Gebiet der dimensionellen Nanometrologie metINFO 2/2004, S. 15-17, 2004 |
| R. Thalmann CCL key comparison: calibration of gauge blocks by interferometry Metrologia, 39, pp. 165-177, 2002 |
| F. Meli Erster CCL-Vergleich im Bereich der Nanometrologie metINFO, 8/2, S. 15-16, 2001 |
Artikel in Fachzeitschriften •
Articles scientifiques • Articles in Scientific Journals • Articoli nelle
riviste specializzate
A. Küng |
A. Küng, F. Meli, R. Thalmann |
F. Meli, A. Küngn |
A. Küng, F. Meli, R. Thalmann |
F. Meli, A. Küng |
R. Thalmann |
R. Thalmann, F. Meli, A. Küng |
L. Koenders, F. Meli |
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F. Meli |
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A. Küng, F. Meli |
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F. Meli, A. Küng, R. Thalmann |
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R. Thalmann, J. Spiller |
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R. Thalmann |
| F. Meli, A. Küng Performance of a low force 3D touch probe on an ultraprecision CMM for small parts Euspen 4 th Int. Conference on Precision Engineering and Nanotechnology, Proc., pp. 270-271, 2004 |
| F. Meli Roughness measurements according to existing standards with a metrology AFM profiler Proceedings of the 3rd Int. Euspen Conference, F. L. M. Delbressine et al. (Eds.), May 2002, Eindhoven, The Netherlands, 2, pp. 533-536, 2002 |
| F. Meli Application of a metrology AFM profiler for various dimensional measurands Fine mechanics and optics journal, 2002, Czech Republic, in press |
| F. Meli Particle diameter calibration by means of a metrology AFM Proceedings of the 1st EUSPEN Topical Conference on Fabrication and Metrology in Nanotechnology, L. De Chiffre and K. Carneiro (Editors), DK-Copenhagen, vol. 1, pp. 45-51, 2000 |
| F. Meli Critical dimension (CD) measurements using a metrology AFM profiler Proceedings of the 4th Seminar on Quantitative Microscopy, K. Hasche, W. Mirandé, G. Wilkening (Editors), PTB-Bericht PTB-F-39, S. 58- 65, 2000 |
| R. Thalmann Vorstoss in neue Dimensionen Schweizer Maschinenmarkt, . 31, S. 135-140, 2001 |
| R. Thalmann EUROMET key comparison: cylindrical diameter standards Metrologia, 37, pp, 253-260, 2000 |
| R. Thalmann Thermal expansion measurement of gauge blocks (international comparison) Metrologia 33, 187, 1996 |
| H. Haitjema,
H. Bosse, R. Thalmann, A. Sacconi International comparison of roundness profiles with nanometric accuracy Metrologia 33, 67, 1996 |
| R. Thalmann Intercomparison of parallelism measurements Measurement 17, 17, 1996 |
| B. G. Vaucher,
R. Thalmann, H. Baechler European comparison of short gauge block measurement by interferometry Metrologia 32, 79, 1995 |
| B. Vaucher,
R. Thalmann CCDM comparison of gauge block measurements Metrologia 35, 97, 1998 |
| R. Thalmann The network of international comparisons in gauge block metrology Proc. SPIE 3477, 1998 |
| W. Hou,
R. Thalmann Thermal expansion measurement of gauge blocks Proc. SPIE 3477, 1998 |
| F. Meli,
R. Thalmann Z-calibration of a metrology AFM scanner using an interferometer and a tilting device together with a linear displacement stage Proc. of the 3rd seminar on quantitative microscopy, K. Hasche et al. (Eds.), Braunschweig, PTB-Bericht,PTB-F-34, 61, 1998 |
| F. Meli,
R. Thalmann Long-range AFM profiler used for accurate pitch measurements Measurements Science and Technology 9(7),1087, 1998 |
| F. Meli,
R. Thalmann Pitch measurements of calibration grids using a metrology AFM and a linear displacement stage Proc. of the 2nd seminar on quantitative microscopy, K. Hasche et al. (Eds.), Braunschweig, PTB-Bericht, PTB-F-30, 177, 1997 |
| R. Thalmann A new high precision length measuring machine, Progress in Precision Engineering and Nanotechnology H. Kunzmann et al. (Eds.), Braunschweig, V1, 112, 1997 |
F. Meli |
| R. Thalmann A new high precision length measuring machine, Proceedings 8ème Congrès international de métrologie Besançon, France, 1997 |
| W. Hou,
R. Thalmann Accurate measurements of the refractive index of air Measurement 13, 307, 1994 |