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2009
A. Eichenberger, G. Genevès, P. Gournay
Determination of the Planck constant by means of a watt balance
Eur. Phys. J., Special Topics, 172, 363-383, 2009
B. Jeanneret and S. P. Benz
Application of the Josephson effect in electrical Metrology
Eur. Phys. J., Special Topics, 172, 181-206, 2009
B. Jeanneret, F. Overney, A. Rüfenacht and J. Nissila
Strong attenuation of the transients’ effect on square waves synthesized with a programmable Josephson voltage standard
IEEE Trans. Instrum. Measure., 58, 2009
B. Jeanneret, F. Overney, L. Callegaro, A. Mortara, A. Rüfenacht
Josephson voltage standard-locked sinewaves synthesizer: margins evaluation and stability
IEEE Trans. Instrum. Measure. 58-4, pp.791-796, 2009
F. Piquemal, B. Jeckelmann (editors)
Quantum metrology and fundamental constants
Eur. Phys. J., Special Topics 172, 2009
J. Hoffmann, P. Leuchtmann, J. Ruefenacht, C. Hafner
Propagation constant of a coaxial transmission line with rough surfaces
IEEE Transaction on Microwave Theory and Techniques, Vol. 57, No. 12, pp. 2914-2922, Dec. 2009
J. Hoffmann, P. Leuchtmann, J. Ruefenacht, K. Wong
S-parameters of slotted and slotless coaxial connectors
74th ARFTG Conference, Boulder, Conference Digest, vol. 74, Dec. 2009
J. Hoffmann, P. Leuchtmann, J. Ruefenacht, R. Vahldieck
A Stable Bayesian Vector Network Analyzer Calibration Algorithm
IEEE Transaction on Microwave Theory and Techniques, Vol. 57, No. 4, pp. 869-880, Apr. 2009
2008
A. Eichenberger, H. Baumann, B. Jeanneret and B. Jeckelmann
Reproducibility of the METAS Watt balance
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 12
B. Jeanneret, F. Overney, L. Callegaro and A. Mortara
Josephson voltage standard locked sinewaves synthesizer
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 74
B. Jeckelmann
Universality of the quantum Hall resistance
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 490
F. Ahlers, B. Jeanneret, J. Melcher, F. Overney, J. Schurr and B. M. Wood
Compendium for precise ac measurements of the quantized Hall resistance
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 492
F. Overney
Realization of the Henry at METAS
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 708
F. Overney, B. Jeanneret and A. Mortara
A synchronous sampling system for high precision ac measurements
Conference on precision electromagnetic measurements (CPEM), 8-13 June 2008, Broomfield, CO, USA; conference digest p. 596
F. Pythoud
Measurement of the reflectivity of radio-wave absorbers
Transverse Disciplines in Metrology, Proceedings of the 13th International Metrology Congress, 2007 – Lille, France
F. Pythoud
Unsicherheitsanalyse bei der Characterisierung von EMV-Testgeneratoren
Tagungsbericht 4. Fachtagung Messunsicherheit, 12.-13. Nov. 2008, ISBN 978-3-98-12624-1-4
J. Hoffmann, P. Leuchtmann, A. Kretz, J. Rüfenacht, R. Vahldieck
Characterization of Coaxial Adapters for S-parameter Measurements
38th European Microwave Conference , 28 - 31 October 2008, Amsterdam, NL
M. Zeier
Softwareunterstützte Messunsicherheitsberechnung in der Vektornetzwerkanalyse
Tagungsbericht 4. Fachtagung Messunsicherheit, 12.-13. Nov. 2008, ISBN 978-3-98-12624-1-4
N. M. Zimmerman,W. H. Huber,. B. Simonds, E. Hourdakis, A. Fujiwara, Y. Ono, Y. Takahashi, H. Inokawa, M. Furlan and M. W. Keller
Why the long-term charge offset drift in Si single-electron tunneling transistors is much smaller (better) than in metal-based ones: Two-level fluctuator stability
Journal of applied physics, 104, 033710, 2008
2007
B. Jeanneret, F. Overney
Phenomenological model for frequency-related dissipation in the quantized Hall resistance
IEEE Trans. Instrum. Meas. 56-2, p. 431, 2007
B. Jeckelmann, B. Jeanneret
The application of the Josephson and quantum Hall effects in electrical metrology
Proceedings of the International School of Physics «Enrico Fermi», Course CLXVI, Metrology and Fundamental Constants, pp. 135–170, IOS press, 2007
F. Pythoud
La protection contre les rayonnements électromagnétiques
Sécurité Environnement, Vol. 3, pp. 6–7, 2007
2006
B. Jeckelmann
Einflussgrössen bei elektrischen Kalibrierungen im DC-Bereich
VDI-Berichte 1947, Messunsicherheit praxisgerecht bestimmen, S. 259–371, 2006
F. Overney, B. Jeanneret, B. Jeckelmann, B. M. Wood, J. Schurr
The quantized Hall resistance: towards a primary standard of impedance
Metrologia 43, pp. 409–413, 2006
A. L. Eichenberger, A. Joyet, B. Jeckelmann, B. Jeanneret, P. Richard
Mechanical improvements in the METAS watt balance
Conference on Precision Electromagnetic Measugrements, 9–14 July 2006, Torino, Conf. Digest, pp. 62–63
B. Jeanneret, F. Overney
Phenomenological Model for Finite-Frequency Dissipation in the Quantized Hall Resistance
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 706
M. W. Keller, B. Jeanneret, J. Aumentado
Variability of charge noise in Al-based SET Transistors
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 226
R. Goebel, F. Delahaye, B. Jeckelmann, F. Schopfer, W. Poirier
Preliminary investigations of the use of quantum Hall array resistance standards as travelling standards
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 514
F. Overney, B. Jeanneret, B. Jeckelmann, B. M. Wood, J. Schurr
The quantized Hall resistance: towards a primary standard of impedance
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 696
F. Overney, B. Jeanneret, B. Jeckelmann
Realization of the Farad at METAS: Performance of the automated four terminal-Pair Ratio Bridge
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 478
M. Zeier
On the analysis of multidimensional quantities in measurement comparisons
Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 458
2005
C. Hof, B. Jeanneret, A. Eichenberger, F. Overney, M.W. Keller, M.J. Dalberth
Manipulating single electrons with a seven-junction pump
IEEE Trans. Instrum. Meas., 54, p. 670, 2005
F. Overney, B. Jeanneret, B.M. Wood, J. Schurr
Influence of the dissipation in AC measurements of the quantized Hall resistance
IEEE Trans. Instrum. Meas., 54, p. 658, 2005
J. Schurr, B.M. Wood, F. Overney
Linear frequency dependence in AC resistance measurement
IEEE Trans. Instrum. Meas., 54, p. 512, 2005
2004
M. Kossel, P. Leuchtmann, J. Rüfenacht
Traceable correction method for complex reflection coefficient using calculable air line impedance standards
IEEE Trans. on Instrumentation and Measurement, 51/2, pp. 398-405, 2004
P. Leuchtmann, J. Rüfenacht
On the calculation of the electrical properties of precision coaxial lines
IEEE Trans. on Instrumentation and Measurement, 51/2, pp. 392-397, 2004
B. Jeckelmann, J. Niederhauser
Auf dem Weg zu einer Neudefinition des Kilogramms
pipette, Swiss Laboratory Medicine, Nr. 2, Juni 2004, S. 8-11, 2004
H. Ryser
Background information to the draft CD on CMAD measurement
IEC CISPR/A/WG1, Radio Interference Measurements and Statistical Methods, EMC Instruments Specifications, Shanghai, 2004
W. Schwitz, B. Jeckelmann, P. Richard
Towards a new kilogram definition based on a fundamental constant
C. R. Physique, Vol. 5, pp. 881-892, 2004
2003
H.E. van den Brom, O. Kerkhof, S. V. Lotkhov, S. A. Bogoslovsky, G.-D. Willenberg, H. Scherer, A.B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, P. Delsing, M. Taslakov, Z. Ivanov, H. Nilsson, S. Giblin, P. Kleinschmidt, C. Hof, A. L. Eichenberger, F. Overney, B. Jeanneret, G. Genevès, N. Feltin, L. Devoille, F. Gay, F. Piquemal
Counting electrons one by one - overview of a joint European project
IEEE Trans. Instrum. Meas., 52, pp. 584-589, 2003
C. Hof, B. Jeanneret, A. Eichenberger, F. Overney, S.V. Lotkhov
First steps toward a quantum capacitance standard at METAS
IEEE Trans. Instrum. Meas., 52, pp. 604-607, 2003
R. Behr, J. Kohlmann, J.-T. B. M. Janssen, P. Kleinschmidt, J. M. Williams, S. Djordjevic, J.-P. Lo-Hive, F. Piquemal, P. O. Hetland, D. Reymann, G. Eklund, C. Hof, B. Jeanneret, O. Chevtchenko, E. Houtzager, H. van den Brom, A. Sosso, D. Andreone, J. Nissilä, P. Helistö
Analysis of different measurement stups for a programmable Josephson voltage standard
IEEE Trans. Instrum. Meas., 52, pp. 524-528, 2003
B. Jeckelmann, B. Jeanneret
The quantum Hall effect as an electrical resistance standard
Meas. Sci. Technol., 14, pp. 1229-1236, 2003
F. Delahaye, B. Jeckelmann
Revised technical guidelines for reliable dc measurements of the quantized Hall resistance
Metrologia, 40, pp. 217-223, 2003
M. Furlan, S. V. Lotkhov
Electrometry on charge traps with a single-electron transistor
Phys. Rev. B, 67, 2003
A. Eichenberger, B. Jeckelmann, P. Richard
Tracing Planck's constant to the kilogram by electromechanical methods
Metrologia, 40, pp. 356-365, 2003
W. Beer, A. L. Eichenberger, B. Jeanneret, B. Jeckelmann, A. R. Pourzand, P. Richard, J. P. Schwarz
Status of the METAS watt balance experiment
IEEE Trans. Instrum. Meas., 52, pp. 626-630, 2003
F. Overney, B. Jeanneret, B. Jeckelmann
Effects of metallic gates on AC measurements of the quantum Hall resistance
IEEE Trans. Instrum. Meas., 52, pp. 574-578, 2003
J. Melcher, J. Schurr, K. Pierz, J. M. Williams, S. P. Giblin, F. Cabiati, L. Callegaro, G. M. Marullo-Reedtz, C. Cassiago, B. Jeckelmann. B. Jeanneret, F. Overney, J. Bohacek, J. Riha, O. Power, J. Murray, M. Nunes, M. Lobo, I. Godhino
The European AC-QHE project: Modular system for the calibration of capacitance standards based on the quantum Hall effect
IEEE Trans. Instrum. Meas., 52, pp. 563-568, 2003
BUWAL / METAS (H. Ryser, K. Hilty)
Messempfehlung: Nichtionisierende Strahlung von Mobilfunk-Basistationen (GSM)
BUWAL-Schriftenreihe
2001
W. Beer, B. Jeanneret, B. Jeckelmann, P. Richard, H. Schneiter, A. Pourzand, A. Courteville, R. Dändliker
The OFMET watt balance: Progress report
IEEE Trans. Instrum. Meas., IM-50, pp. 583-586, 2001
K. Hilty, H. Ryser, U. Herrmann
Calibration of Electronic Discharge Generators and Results of an International Comparison
IEEE Trans. Instrum. Meas., IM-50, pp. 414 - 418, 2001
B. Jeckelmann, B. Jeanneret
The quantum Hall effect as an electrical resistance standard
Rep. Prog. Phys., 64(12), pp. 1603-1656, 2001
B. Jeanneret, A. Rüfenacht, C.J. Burroughs
Comparison between the SNS and SIS Josephson voltage standards at OFMET
IEEE Trans. Instrum. Meas., IM-50, pp. 188-191, 2001
B. Jeckelmann, A. Rüfenacht, B. Jeanneret, F. Overney, K. Pierz, A. von Campenhausen, G. Hein
Optimization of QHE devices for metrological applications
IEEE Trans. Instrum. Meas., IM-50, p. 218, 2001
H-O. Müller, M. Furlan, T. Heinzel, K. Ensslin
Modelling background charge rearrangements near single-electron transistors as a Poisson process
Eurpophys. Lett., 55(2), pp. 253-259, 2001
B. Jeckelmann
The quantum Hall effect and its application in metrology
Proceedings of the International School of Physics "Enrico Fermi" Course CXLVI, T. J. Quinn, S. Leschiutta and P. Tavella (Eds.), pp. 263-290, IOS Press, Amsterdam 2001
2000
M. Furlan, A. L. Eichenberger, T. Heinzel, B. Jeanneret, S. V. Lotkhov
Realistic and relevant models for the description of SET transistors
Physica B 284, p. 1798, 2000
M. Furlan, T. Heinzel, B. Jeanneret, S. V. Lotkhov, K. Ensslin
Non-Gaussian distribution of nearest-neighbour Coulomb peak spacings in metallic single-electron transitors
Europhysics Letters, 49/3, pp. 369-375, 2000
M. Furlan, T. Heinzel, B. Jeanneret, S. V. Lotkhov
Coulomb blockade peak statistics influenced by background charge configuration
J. Low. Temp. Phys., 118, p. 297, 2000
F. Overney, B. Jeanneret, M. Furlan
A tunable vacuum-gap cryogenic coaxial capacitor
IEEE Trans. Instrum. Meas., 49, pp. 1326-1330, 2000
U. Feller
Elektrische Grössen, Einheiten, und Einheitssysteme
Bulletin ders Schweizerischen Elektronischen Vereins 3/2000
1999
K. Hilty
Attenuation Measurement
Wiley Encyclopedia of Electrical and Electronics Engineering, Vol. 2, pp. 1-17, 1999
W. Beer, B. Jeanneret, B. Jeckelmann, P. Richard
A proposal for a new moving coil experiment
IEEE Trans. Instrum. Meas., IM-48, pp.192-195, 1999
B. Jeanneret, B. Jeckelmann , B. D. Hall
Contactless measurements of the internal capacitance of a Corbino ring in the quantum Hall regime
IEEE Trans. Instrum. Meas., IM-48, pp. 301-304, 1999
1998
M. Flüeli, W. Fasel
A fast switching system for ac-dc transfer measurements
Conference on Precision Electromagnetic Measurements (CPEM), Washington DC 1998, Conf. Digest
M. Furlan
Divergence of the dielectric function with the delocalization transition of quantized 2D electrons
Helv. Phys. Acta 71, p. 15, 1998
M. Furlan, A. L. Eichenberger, E. Käch, B. Jeanneret, B. Jeckelmann
Single-electron tunneling devices as a possible dc current standard
Helv. Phys. Acta 71, p. 5, 1998
M. Furlan
Electronic transport and the localization length in the quantum Hall effect
Phys. Rev. B 57, p. 14818, 1998
M. Furlan
Activated conductivities and nonuniversal behaviour in large high mobility Hall bars
Physica B 249, p. 123, 1998
1997
B. Jeckelmann, B. Jeanneret, A. D. Inglis
High precision measurements of the quantized Hall resistance - experimental conditions for universality
Phys. Rev. B55/19, pp. 13124, 1997
B. Jeanneret, B.D. Hall, B. Jeckelmann, U. Feller, H.J. Bühlmann, M. Ilegems
AC measurements of edgeless currents in a Corbino ring in the quantum Hall regime
Solid State Commun. 102, p. 287, 1997
B. Jeckelmann, B. Jeanneret
Influence of the voltage contacts on the 4-terminal quantized Hall resistance in the non-linear regime
IEEE Trans. Instrum. Meas. IM-46, p. 276, 1997
B. Jeanneret, B. Jeckelmann, H.-J. Bühlmann, M. Ilegems
Influence of infrared illumination on the quantized Hall resistance
IEEE Trans. Instrum. Meas. IM-46, p. 285, 1997
1996
B. Jeckelmann, A. D. Inglis, B. Jeanneret
Are anomalous values of the quantized Hall resistance really anomalous?
Metrologia 33, p. 499, 1996
1995
B. Jeanneret, B. D. Hall, H. J. Bühlmann, R. Houdré, M. Ilegems, B. Jeckelmann, U. Feller
Observation of the integer quantum Hall effect by magnetic coupling to a Corbino ring
Phys. Rev. B51, p. 9752, 1995
B. Jeckelmann, A. D. Inglis, B. Jeanneret
Material, device and step independence of the quantized Hall resistance
IEEE Trans. Instrum. Meas. IM-44, p. 269, 1995
B. Jeanneret, B. Jeckelmann, H. J. Bühlmann, R. Houdré, M. Ilegems
Influence of the device-width on the accuracy of quantization in the integer Hall effect
IEEE Trans. Instrum. Meas. IM-44, p. 254, 1995
B. Jeckelmann, W. Fasel, B. Jeanneret
Improvements in the realisation of the quantized Hall resistance standard at OFMET
IEEE Trans. Instrum. Meas. IM-44, p. 265, 1995
1991
B. Jeckelmann, W. Schwitz, H. J. Bühlmann, R. Houdré, M. Ilegems, D. Jucknischke, M. A. Py
Comparison of the quantized Hall resistance in different GaAs/AlGaAs heterostructures
IEEE Trans. Instrum. Meas. IM-40, p. 231, 1991
D. Jucknischke, H. J. Bühlmann, R. Hondré, M. Ilegems, M. A. Py, B. Jeckelmann, W. Schwitz
Properties of alloyed AuGeNi contacts on GaAs/AlGaAs heterostructures
IEEE Trans. Instrum. Meas. IM-40, p. 228, 1991
1987
W. Schwitz, L. Bauder, H. J. Bühlmann, M. A. Py, M. Ilegems
The quantum Hall effect as a standard to define the laboratory unit of resistance
IEEE Trans. Instrum. Meas. IM-36, p. 240, 1987