Elektrizität • Electricité • Elettricità • Electricity
METinfo-Fachbeiträge • Articles dans METinfo • metINFO articles • Articoli nel METinfo
| F. Overney Réalisation de l'échelle des capacités à METAS  METinfo,
Vol. 14, No. 3, S. 4–9, 2007
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| G. Couvreur, F. Pythoud Prüfung elektronischer Messgeräte auf elektromagnetische Verträglichkeit METinfo,
Vol.14, No.1, S. 22–23, 2007
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| H. Ryser Code-selektives Messverfahren bestätigt METinfo,
Vol. 14, Nr. 1, S. 13–15, 2007
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| R. Kämpfer, E. Moll Stossstromgenerator: ein neues Prüfgerät für Baumusterprüfungen bei Elektrizitätszählern METinfo,
Vol. 14, No. 2, S. 24–25, 2007
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| H. Ryser Leitergebundene Emission am Netzanschluss METinfo,
Vol. 13, No. 1, S. 16–17, 2006
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| M. Zeier Software automatisiert die Berechnung der Messunsicherheit metINFO Vol. 12, Nr.
2, S. 20-22, 2005 |
| F. Pythoud Invisibles et pourtant on les mesure metINFO, Vol. 12, Nr. 1, S.
4-8, 2005 |
B. Jeckelmann |
| J.
Furrer Die Tücke liegt im Stecker, Hochfrequenz-Metrologie metINFO, 10/1, S. 10-15, 2003 |
P. Leuchtmann, J. Rüfenacht Air lines make impedance traceable to SI base units metINFO, 9/2, S. 10-15, 2002 |
W.
Beer, B. Jeckelmann |
M. Furlan,
B. Jeanneret |
U. Feller |
B. Jeckelmann
und W. Beer |
U.
Feller |
M. Flüeli |
B. Jeckelmann
et B. Jeanneret |
B. Jeckelmann,
H. Bärtschi, W. Fasel |
U.
Feller |
Internationale Messvergleiche • Comparaisons
internationales • International Comparisons • Confronti internazionali
| J. Furrer Kompetenz der METAS-HF-Leistungsmessung bis 50 GHz bestätigt METinfo, Vol. 13, No. 3, S. 14–15, 2006 |
| T. P. Crowley, J. Miall, J. P. M. de Vreede, J. Furrer, A. Michaud, E. Dressler, T. Zhang, K. Shimaoka, J. H. Kim CCEM.RF-S1.CL (GTRF/02-03): RF power measurements with 2.4 mm connectors Metrologia, 43, Tech. Suppl. 01007, 2006 |
| F. Pythoud CCEM.RF-K20: Comparison of electrical field strength measurements Metrologia, 43, Tech. Suppl. 01006, 2006 |
| F. Pythoud Comparaison internationale : compatibilité électromagnétique METinfo, Vol. 13, No. 2, S. 18–19, 2006 |
| R. Stybliková, K. Draxler, B. Jeckelmann Final report of EUROMET project 599: Comparison of voltage ratio standards Metrologia, 42, Tech. Suppl. 01004, 2005 |
| J. Ruefenacht, M. Zeier EUROMET.EM.RF-S16 Final Report: Comparison of scattering parameter measurements in the 2.4 mm line system Metrologia, 42, Tech. Suppl. 01001, 2005 |
| M. Flüeli Transfert AC/DC aux hautes fréquences jusqu’à 100 MHz metINFO, Vol. 12, Nr. 2, S. 17-19, 2005 |
G.M. Marullo-Reedtz, R. Ceri, W. Waldmann, J. Streit,
P. Immonen, I. Blanc, F. Raso, T. Funck, B. Schumacher, E.F. Dierikx,
M. Nunes, P. Vrabček, D. Rudohradský, O. Gunnarsson, K.-E.
Rydler, B. Jeanneret, B. Jeckelmann, T. Pulfer, S. Selçik Turhan,
O. Yilmaz, J.M. Williams, H. Slinde, K. Lind, J. Nicolas, M. Lindic,
E. Flouda, G. Erdos |
| J. Rüfenacht, M. Zeier Scattering parameter measurements in the coaxial 2.4 mm line system metINFO Vol.
12, Nr. 2, S. 14-16, 2005 |
| B. Jeanneret, M. Flüeli, B. Jeckelmann Comparaison européenne pour les niveaux de tension DC jusqu’à 100 kV metINFO 1/2004, S. 19-20, 2004 |
| R. Kämpfer, B. Jeckelmann Europäischer Vergleich von Spannungswandler-Messungen metINFO 3/2004, S. 15-17, 2004 |
B. Jeckelmann |
| T.
Pulfer, B. Jeanneret, B. Jeckelmann Rapports de tension DC 100 V/10 V et 1000 V/ 10 V metINFO, 10/3, S. 18-19, 2003 |
| R. Kämpfer, B. Jeckelmann Europäischer Vergleich von Stromwandler.Messungen metINFO, 10/1, S. 22-23, 2003 |
| H. Ryser Vergleichsmessungen an Mobilfunk-Basisstationen metINFO, 9/2, S. 16-17, 2002 |
| B. Jeckelmann Internationaler Ringversuch mit 10-Mohm- und 1-Gohm Widerstandsnormalen metINFO, 8/2, S. 17-18, 2001 |
| B. Schumacher, P. Warnecke,
W. Poirier, I. Delgado, Z. Msimang, G. Boella, P. O. Hetland, R. E. Elmquist,
J. Williams, D. Inglis, B. Jeckelmann, O. Gunnarsson, A. Satrapinsky Transport behavior of commercially available 100-Ohm standard resistors IEEE Trans. Instrum. Meas., IM-50, p. 242-244, 2001 |
| D. Reymann, T. J. Witt, P.
Vrabcek, Y. Tang, C. A. Hamilton, A. S. Katkov, B. Jeanneret, O. Power Recent developments in BIPM voltage standard comparisons IEEE Trans. Instrum. Meas., IM-50, pp. 206-209, 2001 |
| F. Delahaye, T. J. Witt, B.
Jeckelmann, B. Jeanneret Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM Metrologia, Vol. 32, pp. 385-388, 1995/96 |
| M. Flüeli Intercomparaison EUROMET de tension ac par transfert ac/dc OFMETInfo, 2/3, 1995 |
| B. Jeckelmann Vergleich der Quanten-Hall-Widerstandsnormale des EAM und des BIPM OFMETInfo, 2/1, 1995 |
| D. Reymann, U. Feller, P. de
la Court, T. J. Witt Comparison of the Josephson voltage standard of the BIPM with those of the OFM and the Nmi Metrologia, Vol. 31, pp. 45-48, 1994 |
| F. Delahaye, D. Bournaud ,
T. J. Witt Report on the 1990 international comparison of 1 Ohm and 10 kOhm resistance standards at the BIPM Metrologia, Vol. 29, pp. 273-283, 1992 |
| W. Schwitz, R.
Kämpfer, A. Braun, T. M. Souders, W. J. M. Moore, B. Cassidy, T.
A. Deacon International comparison of current transformer calibrations IEEE Trans. Instrum. Meas. IM-34, 234, 1985 |
Artikel in Fachzeitschriften • Articles scientifiques • Articles in Scientific Journals • Articoli nelle riviste specializzate
| B. Jeanneret, F. Overney Phenomenological model for frequency-related dissipation in the quantized Hall resistance IEEE Trans. Instrum. Meas. 56-2, p. 431, 2007 |
| B. Jeckelmann, B. Jeanneret The application of the Josephson and quantum Hall effects in electrical metrology Proceedings of the International School of Physics «Enrico Fermi», Course CLXVI, Metrology and Fundamental Constants, pp. 135–170, IOS press, 2007 |
| F. Pythoud La protection contre les rayonnements électromagnétiques Sécurité Environnement, Vol. 3, pp. 6–7, 2007 |
| B. Jeckelmann Einflussgrössen bei elektrischen Kalibrierungen im DC-Bereich VDI-Berichte 1947, Messunsicherheit praxisgerecht bestimmen, S. 259–371, 2006 |
| F. Overney, B. Jeanneret, B. Jeckelmann, B. M. Wood, J. Schurr The quantized Hall resistance: towards a primary standard of impedance Metrologia 43, pp. 409–413, 2006 |
| A. L. Eichenberger, A. Joyet, B. Jeckelmann, B. Jeanneret, P. Richard Mechanical improvements in the METAS watt balance Conference on Precision Electromagnetic Measugrements, 9–14 July 2006, Torino, Conf. Digest, pp. 62–63 |
| B. Jeanneret, F. Overney Phenomenological Model for Finite-Frequency Dissipation in the Quantized Hall Resistance Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 706 |
| M. W. Keller, B. Jeanneret, J. Aumentado Variability of charge noise in Al-based SET Transistors Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 226 |
| R. Goebel, F. Delahaye, B. Jeckelmann, F. Schopfer, W. Poirier Preliminary investigations of the use of quantum Hall array resistance standards as travelling standards Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 514 |
| F. Overney, B. Jeanneret, B. Jeckelmann, B. M. Wood, J. Schurr The quantized Hall resistance: towards a primary standard of impedance Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 696 |
| F. Overney, B. Jeanneret, B. Jeckelmann Realization of the Farad at METAS: Performance of the automated four terminal-Pair Ratio Bridge Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 478 |
| M. Zeier On the analysis of multidimensional quantities in measurement comparisons Conference on Precision Electromagnetic Measurements, 9–14 July 2006, Torino, Conf. Digest, p. 458 |
| C. Hof, B. Jeanneret, A. Eichenberger, F. Overney, M.W.
Keller, M.J. Dalberth Manipulating single electrons with a seven-junction pump IEEE Trans. Instrum. Meas., 54, p. 670, 2005 |
| F. Overney, B. Jeanneret, B.M. Wood, J. Schurr Influence of the dissipation in AC measurements of the quantized Hall resistance IEEE Trans. Instrum. Meas., 54, p. 658, 2005 |
| J. Schurr, B.M. Wood, F. Overney Linear frequency dependence in AC resistance measurement IEEE Trans. Instrum. Meas., 54, p. 512, 2005 |
M. Kossel, P. Leuchtmann, J. Rüfenacht |
P. Leuchtmann, J. Rüfenacht |
B. Jeckelmann, J. Niederhauser |
H. Ryser |
W. Schwitz, B. Jeckelmann, P. Richard |
| H.E.
van den Brom, O. Kerkhof, S. V. Lotkhov, S. A. Bogoslovsky, G.-D. Willenberg,
H. Scherer, A.B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, P.
Delsing, M. Taslakov, Z. Ivanov, H. Nilsson, S. Giblin, P. Kleinschmidt,
C. Hof, A. L. Eichenberger, F. Overney, B. Jeanneret, G. Genevès,
N. Feltin, L. Devoille, F. Gay, F. Piquemal Counting electrons one by one - overview of a joint European project IEEE Trans. Instrum. Meas., 52, pp. 584-589, 2003 |
| C.
Hof, B. Jeanneret, A. Eichenberger, F. Overney, S.V. Lotkhov First steps toward a quantum capacitance standard at METAS IEEE Trans. Instrum. Meas., 52, pp. 604-607, 2003 |
| R.
Behr, J. Kohlmann, J.-T. B. M. Janssen, P. Kleinschmidt, J. M. Williams,
S. Djordjevic, J.-P. Lo-Hive, F. Piquemal, P. O. Hetland, D. Reymann,
G. Eklund, C. Hof, B. Jeanneret, O. Chevtchenko, E. Houtzager, H. van
den Brom, A. Sosso, D. Andreone, J. Nissilä, P. Helistö Analysis of different measurement stups for a programmable Josephson voltage standard IEEE Trans. Instrum. Meas., 52, pp. 524-528, 2003 |
| B.
Jeckelmann, B. Jeanneret The quantum Hall effect as an electrical resistance standard Meas. Sci. Technol., 14, pp. 1229-1236, 2003 |
| F.
Delahaye, B. Jeckelmann Revised technical guidelines for reliable dc measurements of the quantized Hall resistance Metrologia, 40, pp. 217-223, 2003 |
| M.
Furlan, S. V. Lotkhov Electrometry on charge traps with a single-electron transistor Phys. Rev. B, 67, 2003 |
| A.
Eichenberger, B. Jeckelmann, P. Richard Tracing Planck's constant to the kilogram by electromechanical methods Metrologia, 40, pp. 356-365, 2003 |
| W.
Beer, A. L. Eichenberger, B. Jeanneret, B. Jeckelmann, A. R. Pourzand,
P. Richard, J. P. Schwarz Status of the METAS watt balance experiment IEEE Trans. Instrum. Meas., 52, pp. 626-630, 2003 |
| F.
Overney, B. Jeanneret, B. Jeckelmann Effects of metallic gates on AC measurements of the quantum Hall resistance IEEE Trans. Instrum. Meas., 52, pp. 574-578, 2003 |
| J.
Melcher, J. Schurr, K. Pierz, J. M. Williams, S. P. Giblin, F. Cabiati,
L. Callegaro, G. M. Marullo-Reedtz, C. Cassiago, B. Jeckelmann. B. Jeanneret,
F. Overney, J. Bohacek, J. Riha, O. Power, J. Murray, M. Nunes, M. Lobo,
I. Godhino The European AC-QHE project: Modular system for the calibration of capacitance standards based on the quantum Hall effect IEEE Trans. Instrum. Meas., 52, pp. 563-568, 2003 |
| BUWAL / METAS (H. Ryser, K. Hilty) Messempfehlung: Nichtionisierende Strahlung von Mobilfunk-Basistationen (GSM) BUWAL-Schriftenreihe |
W. Beer,
B. Jeanneret, B. Jeckelmann, P. Richard, H. Schneiter, A. Pourzand,
A. Courteville, R. Dändliker The OFMET watt balance: Progress report IEEE Trans. Instrum. Meas., IM-50, pp. 583-586, 2001 |
K. Hilty,
H. Ryser, U. Herrmann Calibration of Electronic Discharge Generators and Results of an International Comparison IEEE Trans. Instrum. Meas., IM-50, pp. 414 - 418, 2001 |
B. Jeckelmann,
B. Jeanneret The quantum Hall effect as an electrical resistance standard Rep. Prog. Phys., 64(12), pp. 1603-1656, 2001 |
B. Jeanneret,
A. Rüfenacht, C.J. Burroughs Comparison between the SNS and SIS Josephson voltage standards at OFMET IEEE Trans. Instrum. Meas., IM-50, pp. 188-191, 2001 |
B. Jeckelmann,
A. Rüfenacht, B. Jeanneret, F. Overney, K. Pierz, A. von Campenhausen,
G. Hein |
| H-O. Müller, M. Furlan,
T. Heinzel, K. Ensslin Modelling background charge rearrangements near single-electron transistors as a Poisson process Eurpophys. Lett., 55(2), pp. 253-259, 2001 |
| B. Jeckelmann The quantum Hall effect and its application in metrology Proceedings of the International School of Physics "Enrico Fermi" Course CXLVI, T. J. Quinn, S. Leschiutta and P. Tavella (Eds.), pp. 263-290, IOS Press, Amsterdam 2001 |
| M. Furlan, A. L. Eichenberger,
T. Heinzel, B. Jeanneret, S. V. Lotkhov Realistic and relevant models for the description of SET transistors Physica B 284, p. 1798, 2000 |
| M. Furlan, T. Heinzel, B. Jeanneret,
S. V. Lotkhov, K. Ensslin Non-Gaussian distribution of nearest-neighbour Coulomb peak spacings in metallic single-electron transitors Europhysics Letters, 49/3, pp. 369-375, 2000 |
| M. Furlan, T. Heinzel, B. Jeanneret,
S. V. Lotkhov Coulomb blockade peak statistics influenced by background charge configuration J. Low. Temp. Phys., 118, p. 297, 2000 |
| F. Overney, B. Jeanneret, M.
Furlan A tunable vacuum-gap cryogenic coaxial capacitor IEEE Trans. Instrum. Meas., 49, pp. 1326-1330, 2000 |
| U. Feller Elektrische Grössen, Einheiten, und Einheitssysteme Bulletin ders Schweizerischen Elektronischen Vereins 3/2000 |
| K. Hilty Attenuation Measurement Wiley Encyclopedia of Electrical and Electronics Engineering, Vol. 2, pp. 1-17, 1999 |
| W. Beer, B. Jeanneret, B. Jeckelmann,
P. Richard A proposal for a new moving coil experiment IEEE Trans. Instrum. Meas., IM-48, pp.192-195, 1999 |
| B. Jeanneret, B. Jeckelmann
, B. D. Hall Contactless measurements of the internal capacitance of a Corbino ring in the quantum Hall regime IEEE Trans. Instrum. Meas., IM-48, pp. 301-304, 1999 |
| M. Flüeli, W. Fasel A fast switching system for ac-dc transfer measurements Conference on Precision Electromagnetic Measurements (CPEM), Washington DC 1998, Conf. Digest |
| M. Furlan Divergence of the dielectric function with the delocalization transition of quantized 2D electrons Helv. Phys. Acta 71, p. 15, 1998 |
| M. Furlan, A. L. Eichenberger,
E. Käch, B. Jeanneret, B. Jeckelmann Single-electron tunneling devices as a possible dc current standard Helv. Phys. Acta 71, p. 5, 1998 |
| M. Furlan Electronic transport and the localization length in the quantum Hall effect Phys. Rev. B 57, p. 14818, 1998 |
| M. Furlan Activated conductivities and nonuniversal behaviour in large high mobility Hall bars Physica B 249, p. 123, 1998 |
| B. Jeckelmann, B. Jeanneret,
A. D. Inglis High precision measurements of the quantized Hall resistance - experimental conditions for universality Phys. Rev. B55/19, pp. 13124, 1997 |
| B. Jeanneret, B.D. Hall, B.
Jeckelmann, U. Feller, H.J. Bühlmann, M. Ilegems AC measurements of edgeless currents in a Corbino ring in the quantum Hall regime Solid State Commun. 102, p. 287, 1997 |
| B. Jeckelmann, B. Jeanneret Influence of the voltage contacts on the 4-terminal quantized Hall resistance in the non-linear regime IEEE Trans. Instrum. Meas. IM-46, p. 276, 1997 |
| B. Jeanneret, B. Jeckelmann,
H.-J. Bühlmann, M. Ilegems Influence of infrared illumination on the quantized Hall resistance IEEE Trans. Instrum. Meas. IM-46, p. 285, 1997 |
| B. Jeckelmann, A. D. Inglis,
B. Jeanneret Are anomalous values of the quantized Hall resistance really anomalous? Metrologia 33, p. 499, 1996 |
| B. Jeanneret, B. D. Hall, H.
J. Bühlmann, R. Houdré, M. Ilegems, B. Jeckelmann, U. Feller Observation of the integer quantum Hall effect by magnetic coupling to a Corbino ring Phys. Rev. B51, p. 9752, 1995 |
| B. Jeckelmann, A. D. Inglis,
B. Jeanneret Material, device and step independence of the quantized Hall resistance IEEE Trans. Instrum. Meas. IM-44, p. 269, 1995 |
| B. Jeanneret, B. Jeckelmann,
H. J. Bühlmann, R. Houdré, M. Ilegems Influence of the device-width on the accuracy of quantization in the integer Hall effect IEEE Trans. Instrum. Meas. IM-44, p. 254, 1995 |
| B. Jeckelmann, W. Fasel, B.
Jeanneret Improvements in the realisation of the quantized Hall resistance standard at OFMET IEEE Trans. Instrum. Meas. IM-44, p. 265, 1995 |
| B. Jeckelmann, W. Schwitz,
H. J. Bühlmann, R. Houdré, M. Ilegems, D. Jucknischke, M.
A. Py Comparison of the quantized Hall resistance in different GaAs/AlGaAs heterostructures IEEE Trans. Instrum. Meas. IM-40, p. 231, 1991 |
| D. Jucknischke, H. J. Bühlmann,
R. Hondré, M. Ilegems, M. A. Py, B. Jeckelmann, W. Schwitz Properties of alloyed AuGeNi contacts on GaAs/AlGaAs heterostructures IEEE Trans. Instrum. Meas. IM-40, p. 228, 1991 |
| W. Schwitz, L.
Bauder, H. J. Bühlmann, M. A. Py, M. Ilegems The quantum Hall effect as a standard to define the laboratory unit of resistance IEEE Trans. Instrum. Meas. IM-36, p. 240, 1987 |
